Infrared imaging detector

ABSTRACT

The present specification generally relates to the field of imaging device and particularly discloses an imaging device for detecting infrared radiation. The imaging device comprises a first set of detectors responsive to infrared electromagnetic radiation in a first wavelength band, a second set of detectors and a filter disposed above the second set of detectors to prevent registration of electromagnetic radiation outside a second wavelength band at the second set of detectors. The second wavelength band is a subset of the first wavelength band. The imaging device is configured to detect a deviation from an expected value of a level of electromagnetic radiation in a third wavelength band based on signals obtained from the first set of detectors and the second set of detectors. The third wavelength band is within the first wavelength band and outside the second wavelength band.

CROSS REFERENCE TO RELATED APPLICATION

This application is a 35 U.S.C. § 371 National Phase Entry Applicationfrom PCT/EP2015/061432, filed May 22, 2015, and designating the U.S.,the disclosure of which is incorporated herein in its entirety byreference.

TECHNICAL FIELD

The present specification generally relates to the field of imagingdevices and particularly to an imaging device based on detection ofinfrared radiation.

TECHNICAL BACKGROUND

All objects with a temperature above absolute zero emit heat energy inthe form of radiation. An infrared sensor is a device used to senseinfrared radiation. Using a pixelated infrared sensor such as in forinstance an infrared camera, an image can be obtained using infraredradiation instead of visible light. Infrared radiation ranges fromapproximately 0.75 micrometers to 1000 micrometers and the spectralselectivity of a pixelated infrared sensor may be limited by means of apass-band filter determining a wavelength band of operation of thepixelated infrared sensor.

Infrared cameras may be used in a wide range of applications such assecurity and defense as well as industrial applications. In particular,infrared cameras may be used for gas detection applications or varioustypes of surveying applications wherein a substance (such as a gas) tobe detected emits, reflects and/or absorbs infrared radiation within aspecific wavelength band. However, the information provided by currentinfrared imaging sensors is still limited and a number of processingsteps may be required for determining presence of such substance in animage captured by the imaging sensor. In general, imaging sensorsproviding a more reliable detection are desired. For at least thosereasons, there is still a need of improved infrared imaging sensors.

SUMMARY

An object of at least some embodiments of the present disclosure is towholly or partly overcome at least some of the above disadvantage(s) ofprior art infrared imaging sensors and to provide an improved imagingdevice.

This and other objects are achieved by means of the imaging deviceaccording to the independent claim. Preferred embodiments are set forthin the dependent claims.

According to an embodiment, an imaging device is provided. The imagingdevice comprises a first set of detectors, a second set of detectors anda filter. The first set of detectors is responsive to infraredelectromagnetic radiation in a first wavelength band. The filter may bedisposed above the second set of detectors to prevent registration ofelectromagnetic radiation outside a second wavelength band at saidsecond set of detectors. The second wavelength band is a subset of thefirst wavelength band. The imaging device may be configured to detect adeviation from an expected value of a level of electromagnetic radiationin a third wavelength band based on signals obtained from the first setof detectors and the second set of detectors. The third wavelength bandis within the first wavelength band and outside the second wavelengthband.

In the present embodiment, spectral filtering is provided at leastpartly by means of the filter disposed above (or on top of) the secondset of detectors. The filter may for example function as a pass-bandfilter in that electromagnetic radiation of the second wavelength bandis transmitted to the second set of detectors while electromagneticradiation outside the second wavelength band is attenuated or blocked(is not transmitted). However, this is only one example and the filtermay also be a high-pass filter or a low-pass filter, thereby determiningone boundary of the second wavelength band, the other boundary beingdetermined by the spectral sensitivity of the detectors of the secondset or by any additional filter. In the imaging device of the presentembodiment, the detectors of the second set are configured to registerelectromagnetic radiation within the second wavelength band.

With this filter, the second set of detectors is configured to registeror detect electromagnetic radiation of a second wavelength band which isa subset of (i.e. narrower than) the first band of wavelengths to whichthe first set of detectors is responsive (or is configured to register).Rather than being configured to provide information aboutelectromagnetic radiation of the second wavelength band, the imagingdevice of the present embodiment is configured to provide informationabout a third wavelength band which is within the first wavelength bandbut outside the second wavelength band. The region, or wavelength band,of interest is therefore outside the wavelength band at least partlydetermined by the filter. In other words, the imaging device isconfigured to provide information about a wavelength band for which thesecond set of detectors, on top of which a filter is disposed, is notresponsive (or is not configured to register electromagnetic radiation),at least partly because of the presence of the filter.

It will be appreciated that in some embodiments, the first set ofdetectors and the second set of detectors may both be, as such,sensitive to the first wavelength band in that the detectors themselvesmay be sensitive to the first wavelength band. This could for example bethe case if the first set of detectors and the second set of detectorsare made of the same material for forming a pixelated solid-statesensor. However, in the imaging device of the present embodiment, thedetectors of the second set of detectors do not provide signalsrepresentative of the full width of the first wavelength band because ofthe presence of the filter. Using different arrangements, as will beexplained in more detail in further embodiments, in the imaging device,the first set of detectors is configured to register electromagneticradiation within the first wavelength band while the second set ofdetectors is configured to register electromagnetic radiation within thesecond wavelength band. With the term register, it is meant that in theimaging device, a detector (or set of detectors) is configured toprovide a signal for a specific wavelength band while it will be less(and possibly not) responsive to electromagnetic radiation havingwavelengths outside this specific wavelength band.

As the third wavelength band is within the first wavelength band, thefirst set of detectors do not directly correspond to information aboutthe third wavelength band. However, signals obtained from the detectorsof the first set of detectors include information about electromagneticradiation within the third wavelength band (and the second wavelengthband). As the third wavelength band corresponds to the differencebetween the first wavelength band and the second wavelength band (i.e.the first wavelength band without the second wavelength band), theimaging device can be configured to provide information aboutelectromagnetic radiation in the third wavelength band based on signalsobtained by the first set of detectors and the second set of detectors.

In particular, the imaging device of the present embodiment may beconfigured to detect a deviation from an expected value of a level (oramplitude) of electromagnetic radiation in the third wavelength bandbased on the signals obtained from the first set of detectors and thesecond set of detectors.

The first set of detectors and the second set of detectors may bearranged in a common plane. For example, the first set of detectors andthe second set of detectors may be arranged in a two dimensional arrayto form the basic structure of the imaging device. It will beappreciated that the detectors may in some embodiments also be referredto as pixels of the imaging device such that the imaging device ispixelated. Some of the pixels may belong to the first set of detectors(i.e. corresponding to a first group, or set, of pixels) while otherpixels may belong to the second set of detectors (i.e. corresponding toa second group, or set, of pixels). In the following, reference maytherefore be made to a pixel or pixels of the first set, or the secondset, instead of a detector or detectors of the first set, or the secondset.

With the imaging device of the present embodiment, a more reliabledetection is obtained since it is a deviation from an expected value ofthe level of electromagnetic radiation in the third wavelength band thatis detected. The deviation is representative of a difference between asignal indicative of the level of electromagnetic radiation in the thirdwavelength band, as may be derived from a signal obtained from onedetector of the first set of detectors, and the expected value, as maybe derived from signal(s) obtained from one or more detectors of thesecond set of detectors. Thus, if there is a deviation from the expectedvalue, as may be illustrated by a positive or negative differencebetween a value related to the signal obtained from a detector of thefirst set of detectors and a value related to the signal(s) obtainedfrom one or more surrounding detectors of the second set of detectors,as will be explained in more detail in the following, then presence of asubstance having for example an absorption peak (or a transmission peakor a reflectance peak) within the third wavelength band is detected.With the imaging device of the present embodiment, a direct detection ofthe substance is achieved in that the deviation is indicative ofelectromagnetic radiation in the third wavelength band only. The firstwavelength band and the second wavelength band may therefore be adjustedto achieve an imaging device sensitive in a specific third wavelengthband characteristic of a specific substance. A more reliable and/oraccurate detection is obtained in that the deviation from the expectedvalue is representative of the properties of the substance in the thirdwavelength band only.

In comparison, in prior art imaging sensors wherein all or some pixelsmay be equipped with a band-pass filter for detecting electromagneticradiation of a specific wavelength band, a signal obtained from suchpixels may be occasioned by a substance having an absorption peak withinthe specific wavelength band only but may also be occasioned by anyother objects, for example flying objects such as a bird, providingelectromagnetic radiation in a broader range of wavelengths includingthe specific wavelength band. Thus, detection of a signal at a pixel insuch prior art imaging sensors may not only be characteristic of asubstance having an absorption peak in the third wavelength band onlybut also any object presenting absorbing/emitting properties in a widerrange of wavelengths than just the third wavelength band. Such prior artimaging sensors may therefore require a rather complicated andtime-consuming processing of the images, either via a computer or via anoperator, in order to identify whether the contribution ofelectromagnetic radiation originates from the substance to be identifiedor from another source. In for example gas detection applications, itmay be required that an operator observes the captured image(s) toinvestigate whether the detected signal originates from a gas cloud oranother object (such as a bird or other sources) emitting also infraredradiation within the specific wavelength band of interest. Further,prior art imaging sensors suffer from not having a reference level forthe signals in the pixels such that a signal level in a pixel cannot beassociated with presence of a gas. The use of such sensors is thereforelimited when imaging for instance gas saturated environments since thereis no area without gas to refer to or for comparing a signal level withanother.

In contrast, in the imaging device of the present embodiment, detectingthe deviation of the level (or amplitude) of electromagnetic radiationin the third wavelength band based on the signals obtained by the firstset of detectors and the second set of detectors allows for presencedetection of a substance having contributed to the signal only becauseof electromagnetic radiation in the third wavelength band. Thus, withthe imaging device of the present embodiment, the risk of errordetection, in the sense that a signal may be obtained from other sourcesthan the substance of interest (i.e. the substance the imaging device isconfigured to detect), is reduced (and possibly eliminated).

In the present embodiment, if an object contributes to a signal in thethird wavelength band and the second wavelength band, the contributionof this object in the third wavelength band will be suppressed as theimaging device is configured to detect the deviation from the expectedvalue based on the signals from the first set of detectors and thesecond set of detectors. In other words, it will be identified that ithas also contributed to the signal in the second wavelength band sincethe first set of detectors is responsive to electromagnetic radiation inthe first wavelength band (covering both the second wavelength band andthe third wavelength band) and the second set of detectors is responsiveto electromagnetic radiation in the second wavelength band.

For applications in which a gas having an absorption peak (or atransmission peak or a reflectance peak) at a specific wavelength (orwithin a specific wavelength band) has to be detected, detectingdeviation from the expected value in the specific wavelength bandcorresponds to having an own channel for detection of the gas, i.e.looking only at the contribution of the gas. As such, the detectionbecomes more automatic in that presence of the substance may be directlydetected at a specific pixel (or detector of the first set ofdetectors), i.e. a specific channel, via detection of the deviation fromthe expected value and thus less post-processing of the captured imageis required.

Further, the imaging device of the present embodiment is advantageousover prior art imaging sensors (in that detection in a gas saturatedenvironment is possible since the signal level in a pixel of the firstgroup of pixels is related to a signal level of a background as detectedby one or more of the pixels of the second group of pixels.

In one embodiment, at least one detector of the second set of detectorsmay be configured to generate a reference signal corresponding to abackground level of electromagnetic radiation in the second wavelengthband and the expected value may be derived from the reference signal. Itwill be appreciated that the background level (or level of backgroundelectromagnetic radiation) in the third wavelength band may not directlycorrespond to the signal level in the second wavelength band but may atleast be obtained from (or based on) signals from one or a plurality ofdetectors of the second set of detectors.

In a particular embodiment, for detecting presence of electromagneticradiation at a certain pixel of the imaging detector (i.e. a certainpixel of the first set), the background level may be obtained fromreference signals obtained by detectors of the second set of detectorssurrounding this certain pixel of the first set. In the array ofdetectors, different expected values may be used for different pixels ofthe first set.

The expected value may be derived from the reference signal(s) and maytherefore be representative of the background level of electromagneticradiation of the area surveyed or imaged by (a pixel or detector of thefirst set of detectors of) the imaging device. A deviation from thebackground level in signals obtained by detectors of the first set ofdetectors may then be detected. Any such deviation will berepresentative of the presence of a substance having an absorption peak(or transmission peak or reflectance peak) in the third wavelength band.Further, as the expected value is determined based on measurementsperformed by the second set of detectors, a real time adaptation to theactual conditions is obtained. Consequently, a more reliable andaccurate imaging is achieved.

It will be appreciated that in the present embodiments, for a capturedimage, the signals obtained by the pixels of the first set may becompensated for the contribution of the background electromagneticradiation such that the resulting signals indicate presence ofelectromagnetic radiation different from the background, such as e.g.because of a gas, in the third wavelength band.

In one embodiment, the expected value may correspond to (or may bederived from) background electromagnetic radiation of a known spectraldistribution in the third wavelength band. In particular, the knownspectral distribution may correspond to radiation from a black bodyradiator, a grey body radiator and/or a light source. For example, thebackground may be assumed to be a black body radiator having a certainbody temperature, thereby providing a particular spectral distribution(Planck curve). The spectral distribution of the electromagneticradiation provided by the background imaged by the imaging sensor may beknown such that the expected value in the third wavelength band may bederived based on this spectral distribution and one or more signalsobtained from the second set of detectors. The second set of detectorsprovide background information in the second wavelength band so thebackground information in the third wavelength band can be determinedbased on the known spectral distribution and the signals from the secondset of detectors. It will be appreciated that, in some embodiments, alight source may be used to illuminate the object imaged by the imagingsensor in order to increase the signal levels.

In one embodiment, the first set of detectors may be configured togenerate a measurement signal and the imaging device may be configuredto determine the deviation based on the expected value and themeasurement signal. The detectors of the first set generate signalscorresponding to electromagnetic radiation from the first wavelengthband which includes the third wavelength band and the second wavelengthband. As the third wavelength band is the wavelength band of interest,the first set of detectors provide measurement signals which can becompensated for by the background level of electromagnetic radiation inthe third wavelength band, i.e. the expected value, in order to detect adeviation from the expected value and thereby presence of a substancehaving a characteristic in the third wavelength band which the imagingdevice is configured to detect.

In one embodiment, a deviation from the expected value indicatespresence of a medium or substance within a field of view of the imagingdevice. The medium or substance may have an absorption peak, atransmission peak and/or a reflectance peak within the third wavelengthband.

In the absence of a substance in the field of view of the imagingdevice, the measurement signal or a corrected value of the measurementsignal will be equal or similar to the expected value. On the otherhand, in the presence of a substance having a characteristic in thethird wavelength band, a deviation of the measurement signal (or acorrected value of the measurement signal) from the expected value willbe detected. A characteristic of the substance in the third wavelengthband may be a spectral property in the band of interest, such as any ora combination of an absorption peak, a transmission peak and/or areflectance peak.

In one embodiment, the imaging device may be configured to detect anamount of substance or medium in that an amount of deviation from theexpected value is indicative of an amount of medium or substance havingan absorption peak, a transmission peak and/or a reflectance peak in thethird wavelength band. The imaging device may at least provide arelative measurement of the amount of the substance from one detector(or pixel) to another.

In one embodiment, the medium or substance may be a gas. It will beappreciated that the imaging device may be configured to image a volumeor a surface such that it is configured to detect a substance or mediumat such surface (like skin in medical applications) or within suchvolume (like a building, a wall, a pipe in industrial applications orothers). For example, in backlit applications for gas detection, theback light or background may correspond to the expected value and theelectromagnetic radiation corresponding to the absorption wavelength ofthe gas will result in an absorption that in turn affects themeasurement signal and provides a deviation from the expected value.

The gas may be any gas having an absorption peak in the third wavelengthband. The third wavelength band may be suited to any specific gas byadjusting the first wavelength band and the second wavelength band. Thegas may for an example be butane, propane or any other volatile organiccompound (VOC) gas. Other examples of gas may be Sulfur hexafluoride(SF₆).

In one embodiment, the expected value may correspond to a referencesignal obtained by at least one detector of the second set of detectorsand scaled in accordance with a known dependence of the background levelof infrared radiation in the second wavelength band. The referencesignal obtained by at least one detector of the second set of detectorsrepresents the level of electromagnetic radiation provided by thebackground of the imaged environment (i.e. the background in the fieldof view of the imaging detector) in the second wavelength band. As thewavelength band of interest is the third wavelength band, the expectedvalue does not directly correspond to such reference signal. Instead,via a known dependence of the background level of infrared radiation inthe second wavelength band and interpolation, the reference signal maybe scaled such that it corresponds to the background level in the thirdwavelength band, thereby resulting in the expected value form which thedeviation may be detected.

In one embodiment, the second wavelength band may represent a windowcorresponding to longer wavelengths of the first wavelength band. Insome other embodiments, the second wavelength band may represent awindow corresponding to shorter wavelengths of the first wavelengthband. It will be appreciated however that the determination of theexpected value from the signals of the second set of detectors is moreaccurate if the second wavelength band represents a window correspondingto higher signal levels which can allow for a spectrally narrower bandwithout compromising the signal to noise ratio of said band. This inturn depends on the nature of the background radiation and thetemperature of the observed body or environment. A certain black bodyradiator for instance will at a given body temperature presents acertain intensity distribution as a function of the wavelength. Thedistribution may be a Planck curve and may for instance be increasing atshorter wavelengths or decreasing at longer wavelengths. Depending onthe position of the desired third wavelength band (as determined by theabsorbing, transmitting or reflecting properties of the substance to bedetected) the imagining device may be designed such that the secondwavelength band is positioned at the left hand side (i.e. at shorterwavelengths) of the third wavelength band or the opposite. Thus, thepositioning of the second wavelength band may depend on the derivativeof the Planck curve for a given body (environment) and temperature. Thesecond wavelength band may also be designed to provide a narrower bandsuch that the level of background electromagnetic radiation in thesecond wavelength band becomes closer to the expected level ofbackground electromagnetic radiation in the third wavelength band.

In some embodiments, the first set of detectors and the second set ofdetectors may be arranged in a checker board pattern.

The filter may be any type of filter such that only electromagneticradiation of the second wavelength band can be registered at the secondset of detectors. In some embodiments, the filter may be an interferencefilter. For example, the filter may include at least one of thefollowing material amorphous silicon (aSi), silicon dioxide (SiO₂) andsilicon nitride (SiN₂). The filter may for example be made of aSi andSiO₂.

In one embodiment, the filter may be configured to preventelectromagnetic radiation outside a second wavelength band from reachingthe second set of detectors. In this embodiment, the filter may be aband-pass filter in that it may only let electromagnetic radiationhaving wavelengths within a second wavelength band pass through.

In a particular embodiment, the filter may comprise a first filter layerdetermining an upper boundary of the second wavelength band and a secondfilter layer determining a lower boundary of the second wavelength band.In other words, the filter may be made of several layers. It will beappreciated that the layers may in some embodiments be arranged adjacentto each other.

In another embodiment, the filter may be configured to transmitelectromagnetic radiation above a threshold wavelength determining alower boundary of the second wavelength band, the upper boundary beingdetermined by the upper boundary of the first wavelength band. In thisembodiment, the filter may be a high-pass filter in that it may onlytransmit electromagnetic radiation having wavelengths above a certain(or threshold) wavelength. The upper boundary of the second wavelengthband may then be determined by the spectral sensitivity of the detectorsof the second set of detectors or by a filter such as for instance aglobal filter arranged on top of the imaging device.

In another embodiment, the filter may be configured to attenuateelectromagnetic radiation above a threshold wavelength determining anupper boundary of the second wavelength band, the lower boundary beingdetermined by the lower boundary of the first wavelength band. In thisembodiment, the filter may be a low-pass filter in that it may onlytransmit electromagnetic radiation having wavelengths below a certain(or threshold) wavelength. The lower boundary of the second wavelengthband may then be determined by the spectral sensitivity of the detectorsof the second set of detectors or by a filter such as for instance aglobal filter arranged on top of the imaging device.

In some embodiments, at least one of the upper boundary and the lowerboundary of the first wavelength band may be determined by the spectralsensitivity of the detectors of the first set and the second set.

In all examples and embodiments, a filter may comprise several filterlayers from the group of long pass filters, short pass filters, bandblock filters and/or band pass filters. For example a band pass filtermay comprise a long pass filter and a short pass filter, thuseffectively resulting in a band pass filter.

In one embodiment, the filter may be positioned in contact with thesecond set of detectors. In particular, the filter may be arranged indirect physical contact with the second set of detectors.

In one embodiment, the imaging device may comprise an anti-reflectingcoating that may be disposed between the filter and the two-dimensionalarray. The anti-reflecting coating may be a layer applied on the arrayof detectors. For example, the anti-reflecting coating may include atleast one of the following material amorphous silicon (aSi), silicondioxide (SiO₂) and silicon nitride (SiN₂). The use of an anti-reflectingcoating reduces reflection of incoming infrared radiation and ensures ahigher level of signals obtained from the detectors (or pixels) of thearray.

In one embodiment, the imaging device may comprise a global filterdisposed above the two-dimensional array.

In some embodiments, the global filter may be configured to determine atleast one of the upper boundary and the lower boundary of the firstwavelength band. The global filter may for example be a low-pass filterthereby determining the upper boundary of the first wavelength band, theother boundary being determined for instance by the spectral sensitivityof the detectors of the first set. In another example, the global filtermay be a high-pass filter thereby determining the lower boundary of thefirst wavelength band, the other boundary being determined for instanceby the spectral sensitivity of the detectors of the first set. In yetanother example, the global filter may be a band-pass filter.

A global filter may however also be used for protecting the imagingdevice, for instance for avoiding that electromagnetic radiation ofcertain wavelengths which may damage the detectors reaches the first setand second set of detectors.

Alternatively, the global filter may be configured to prevent radiationoutside a fourth wavelength band from reaching the first set ofdetectors and the second set of detectors such that the fourthwavelength band may be a subset of the first wavelength band. Theimaging device may then be configured to detect a deviation from anexpected value of a level of electromagnetic radiation in a thirdwavelength band that is within the fourth wavelength band and outsidethe second wavelength band.

In one embodiment, the second wavelength band may cover approximatelyhalf of the width of the first wavelength band. A lower or higherboundary of the second wavelength band may be arranged close to a loweror higher boundary of the first wavelength band such that a boundary ofthe third wavelength band corresponds to the other boundary of the firstwavelength band. In other words, the second and the third wavelengthband may be arranged adjacent to each other within the first wavelengthband. Further, the third wavelength band may correspond to thedifference between the first wavelength band and the second wavelengthband.

In one embodiment, the first wavelength band may extend fromapproximately 3.2 micrometers to approximately 3.8 micrometers while thesecond wavelength band may extend from approximately 3.5 micrometers toapproximately 3.8 micrometers. The resulting third wavelength band maythen extend from approximately 3.2 micrometers to approximately 3.5micrometers. Such an imaging device may for example be suitable fordetecting volatile organic compound (VOC) gases.

In another embodiment, the first wavelength band may extend fromapproximately 10.3 micrometers to approximately 10.7 micrometers whilethe second wavelength band may extend from approximately 10.3micrometers to approximately 10.5 micrometers. The resulting thirdwavelength band may then extend from approximately 10.5 micrometers toapproximately 10.7 micrometers. Such an imaging device may for examplebe suitable for detecting SF₆.

In one embodiment, the second wavelength band may be positioned relativeto the first wavelength band such that a contribution of a backgroundlevel of electromagnetic radiation in a signal obtained for the secondwavelength band is approximately equal to a signal level obtained forthe third wavelength band.

In one embodiment, the device may be configured to obtain the deviationby subtracting a measurement signal generated by a detector of the firstset of detectors from a corrected mean value of reference signalsgenerated by at least one or some detectors of the second set ofdetectors surrounding the detector of the first set or by subtracting acorrected measurement signal generated by a detector of the first set ofdetectors from a mean value of reference signals generated by at leastone or some detectors of the second set detectors surrounding thedetector of the first set. In the present embodiment, the term“corrected” refers to a correction performed on the measurement toobtain a more accurate value. In particular, the background leveldetected in the second wavelength band by the pixel(s) of the second setis corrected to obtain (or to correspond to) the background level in thethird wavelength band.

In one embodiment, the detectors of the first set of detectors and thesecond set of detectors are calibrated in order to compensate forvariation in gain and/or offset. Here, the term “calibrated” refers to acalibration which may be performed to compensate for variation betweendetectors (pixels) due to e.g. manufacturing reasons such as variationin thickness of the filter on top of the second set of detectors orvariation in sensitivity between various pixels.

In some embodiments, the imaging device may include an optical system(such as e.g. a lens) for altering optical focus in an image captured bythe imaging device in order to compensate for spatial displacementbetween a detector of the first set of detectors (from which ameasurement signal may be obtained) and the one or more detectors of thesecond set of detectors (from which reference signals are used to obtainthe expected value corresponding to the detector of the first set).

In one embodiment, an infrared camera comprising an imaging device inaccordance with any one of the preceding embodiments is provided.

The present disclosure is for example applicable for infrared opticalgas imaging, medical infrared imaging, thermography, non-destructivetesting, process control. In general, imaging devices or camerasaccording to embodiments of the present disclosure may be applicable fordetection of substances at surfaces such as, by way of example,diagnostic of skin diseases (skin cancer) or product screening for e.g.identification of old fruits in the food industry. Other than gas andsolid substances, the imaging device may be suitable for imaging fluids,such as for detection of oil spills.

In the present application, the term imaging device may interchangeablybe replaced with the terms imaging sensor or imaging detector. Theimaging device may be arranged with other elements or parts to form aninfrared camera.

Further, in some embodiments, an imaging camera including an imagingdevice in accordance with any one of the preceding embodiments and anadditional imaging sensor sensitive to visible light may be provided.The integration of the additional imaging sensor would be particularlyadvantageous in case an optical system altering the focus of theinfrared imaging device is used. In any case, the imaging camera may beconfigured to provide an image using visible light onto which anindicator or pointer indicates where a substance (e.g. a gas) has beendetected. The images captured by the two sensors may be synchronized sothat their respective fields of view correspond to each other or atleast overlap. The sensors may also be synchronized in time.

It will be appreciated that other embodiments using all possiblecombinations of features recited in the above described embodiments maybe envisaged.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention is described in the following illustrative andnon-limiting detailed description of exemplary embodiments, withreference to the appended drawings, wherein:

FIG. 1 is a schematic illustration of an imaging device according to afirst embodiment.

FIG. 2 is a graph explaining the operation principle of an imagingdevice in accordance with an embodiment.

FIG. 3 is a schematic perspective view of an imaging device inaccordance with an embodiment.

FIG. 4 is a graph explaining the function of an imaging device inaccordance with an embodiment.

FIG. 5 is a graph explaining the operation principle of an imagingdevice in accordance with an embodiment.

FIG. 6 is a schematic illustration of the wavelength band involved in animaging device in accordance with an embodiment.

FIG. 7 is a cross-sectional view of an imaging device in accordance withan embodiment.

All figures are schematic, not necessarily to scale, and generally onlyshow parts which are necessary in order to elucidate the invention,wherein other parts may be omitted or merely suggested. Throughout thefigures the same reference signs designate the same, or essentially thesame features.

DETAILED DESCRIPTION

Exemplifying embodiments will now be described more fully hereinafterwith reference to the accompanying drawings, in which currentlypreferred embodiments are shown. The invention may, however, be embodiedin many different forms and should not be construed as limited to theembodiments set forth herein; rather, these embodiments are provided forthoroughness and completeness, and fully convey the scope of theinvention to the skilled person.

With reference to FIG. 1, an imaging device according to a firstembodiment is described.

FIG. 1 is a schematic illustration of an imaging device 100 including afirst set of detectors 140, a second set of detectors 150 and a filter120. The first set of detectors 140 is responsive to infraredelectromagnetic radiation in a first wavelength band. The filter 120 ispositioned above the second set of detectors 150 to prevent registrationof electromagnetic radiation outside a second wavelength band at thesecond set of detectors 150. The second wavelength band is a subset ofthe first wavelength band. The imaging device is then configured todetect electromagnetic radiation in a third wavelength band which iswithin the first wavelength band and outside the second wavelength band.

It will be appreciated that although the second set of detectors 150 mayas such be sensitive to infrared electromagnetic radiation in the firstwavelength band (i.e. even outside the second wavelength band), onlyradiation in the second wavelength band are detected by the detectors(or pixels) of the second set of detectors due to the positioning of thefilter 120. Effectively, the first set of detectors 140 detectselectromagnetic radiation in the first wavelength band and the secondset of detectors 150 detects electromagnetic radiation in the secondwavelength band.

In some embodiments, the first set of detectors and the second set ofdetectors may originate from the same solid state imaging sensor. Thedetectors of the solid state imaging sensor may for example be sensitiveto the first wavelength band and a filter may be applied on top of thedetectors of the second set of detectors such that the detectors of thesecond set of detectors may only register electromagnetic radiationwithin the second wavelength band.

Further, it will be appreciated that the present embodiment and allother embodiments of the present disclosure may be implemented using anydetector technology. By way of example, the first set of detectors andthe second set of detectors may be based on type II super latticedetector technology (T2SL), quantum well infrared photodetectortechnology (QWIP), micro bolometer technology, mercury cadmium telluride(MCT) technology, Indium antimonide (InSb) technology or Indium GalliumArsenide (InGaAs) technology. Similarly, the spatial resolution ornumber of pixels in the resulting detector chip may of any size. By wayof example, a 320×256 chip may be used but other formats may be used.

The imaging device may then detect a deviation from an expected value ofthe electromagnetic radiation in the third wavelength band based onsignals obtained from the first set of detectors 140 and the second setof detectors 150. For this purpose, the signals obtained by thedetectors of the first set of detectors 140 and the second set ofdetectors 150 may for example be read out by a readout circuit 180.

For illustrative purposes, the imaging device 100 is shown to observe aregion or area including a wall 190 in front of which a gas cloud 170 ispresent. The aim of the imaging device is then to detect presence of gasin the observed region.

The wall 190 may for example have certain reflectance properties and acertain body temperature such that a certain level of infrared radiationis emitted from the wall (and in general from the environment observedby the imaging device 100, i.e. within the field of view of the imagingdevice 100). The level of electromagnetic radiation present in theobserved region because of all elements or objects other than the gascloud 170 may be referred to as a background level of electromagneticradiation. This may also include objects, animals or human temporarilyplaced in the field of view of the imaging device 100.

In the absence of any gas in the observed region, it may then beexpected that both detectors from the first set of detectors 140 anddetectors from the second set of detectors 150 generate signalscorresponding to the background level. Thus, based on these signals, asmay be read out by the readout circuit 180 for example, the imagingdevice 100 may detect that there is no deviation from the expected valueand therefore that there is no gas in the observed region.

If a gas is present, however, then infrared radiation having awavelength corresponding to the absorption peak of the gas (i.e. thethird wavelength band) may be altered by the gas. The detectors of thesecond set of detectors 150 show a signal level as expected since thesedetectors are configured to detect in the second wavelength band (i.e.not including the third wavelength band). The detectors of the first setof detectors 140 on the other hand will detect a slightly differentsignal (in case of absorption of infrared radiation by the gas) sincethe first wavelength band also covers the third wavelength band. Theexpected value of electromagnetic radiation in the third wavelength bandmay then be determined based on (at least partly) the signals obtainedby the second set of detectors 140. In particular, at least one detectorof the second set of detectors 150 may be configured to generate areference signal corresponding to a background level of electromagneticradiation in the second wavelength band and the expected value may bederived from such reference signal.

It will be appreciated that the presence of a gas which absorbs within acertain wavelength range (or at a certain absorption peak) may also emitinfrared radiation in the same range (or at a wavelength correspondingto the absorption peak). Thus, the present of a gas may not necessarilycorrespond to a lower signal detected in the pixel corresponding to theposition of the gas. Instead, whether the signal will be increased ordecreased will depend as to whether the gas emits infrared radiation ata higher intensity than the background, which in turn may depend on thetemperature of the gas. In particular, if the gas is warmer than thebackground environment, then the signal may be higher, and vice versa.

As will be further illustrated in the following, a correction using thedependence of electromagnetic radiation of a black or grey radiator orother light source on the wavelength may be performed to obtain theexpected value of background electromagnetic radiation in the thirdwavelength band from the reference signal(s) of the second set ofdetectors 150. The signal from a detector of the first set of detectors140 may then be used to determine whether there is a deviation from theexpected value of electromagnetic radiation in the third wavelengthband. Detection of a deviation may then indicate presence of a gas inthe direction observed by the detector of the first of detectors 140 inquestion.

FIG. 2 shows a graph 200 explaining the operation principle in thedetection of an imaging device according to an embodiment. Reference maybe made to the imaging device 100 described with reference to FIG. 1.

In the graph 200, the horizontal axis is divided into three wavelengthbands, namely a first wavelength band 210, a second wavelength band 220and a third wavelength band 230. The second wavelength band 220 and thethird wavelength band 230 are subsets of the first wavelength band 210.It will be appreciated that no scale is given as this graph is providedfor explanatory purposes.

In the present example, the second wavelength band 220 and the thirdwavelength band 230 have approximately equal length (or width) on thehorizontal axis. The third wavelength band 230 is positioned at lowerwavelengths along the horizontal axis than the second wavelength band220.

The curve 250 shown in graph 200 of FIG. 2 illustrates the dependence ofthe amplitude (vertical axis) on the wavelength (horizontal axis) for ablack body radiator or any other background environment. In other words,the curve denoted 250 illustrates the behaviour of the background levelfrom which the expected value of electromagnetic radiation in the thirdwavelength band may be derived based on e.g. the signals obtained from adetector of the second set of detectors 150.

The curve 240 shown in the graph 200 illustrates a possible effect ofthe presence of a gas. As can be seen, if a gas is present with acertain absorption characteristic in the third wavelength band, adeviation denoted 260 from the expected behaviour will be observed. Thedeviation 260 is present in the third band 230.

In the present example, the curve 240 representing behaviour withpresence of gas shows a lower amplitude level than the curve 250representing the expected behaviour in the third wavelength band 220. Adeviation 260 below the expected behaviour is an indication of thepresence of a gas which may e.g. absorb radiation from the background(e.g. the wall 190 behind the gas cloud 170) and also emits lessradiation than the background. This is however only an example and itdepends on the temperature of the gas relative to the temperature of thebackground. In another example, a deviation corresponding to a higheramplitude level, wherein the gas may also absorb electromagneticradiation from the background but emit at a higher level, may indicatepresence of a gas. The amplitude of the deviation 260 (or deviationpeak) is an indication of the amount of absorption in the measuredobject and thus an indication of the amount (or thickness orconcentration) of the object (e.g. a gas) imaged by the imaging device.

It will be appreciated that graph 200 may be considered to illustratebehaviours with and without presence of the image substance such as e.g.a gas, wherein the curve 240 without presence of the substancecorresponds to the expected behaviour. As previously mentioned, from asignal obtained by at least one detector of the second set of detectors150, an expected value may be determined for the level ofelectromagnetic radiation in the third wavelength band. With referenceto e.g. curve 240, the expected value may correspond to electromagneticradiation of a known spectral distribution in the third wavelength band.

Although FIG. 1 shows an example with a wall as a backgroundenvironment, the known spectral distribution may generally correspond toradiation from a black body radiator, a grey radiator or a light source.

With reference to FIG. 3, an imaging device according to anotherembodiment is described.

FIG. 3 shows a schematic perspective view of an imaging device 300comprising a first set of detectors, a second set of detectors and afilter.

The imaging device 300 shown in FIG. 3 is equivalent to the imagingdevice 100 described with reference to FIG. 1 except that more pixels(or detectors) are illustrated. Still, in the imaging device 300illustrated in FIG. 3 only some of the detectors or pixels are shown fornot obscuring the drawing. In particular, the imaging device 300includes a detector 341 of the first set of detectors and four detectors351-354 of the second set of detectors.

As illustrated in FIG. 3, the detectors 351-354 of the second set ofdetectors are covered by a filter 320 while the detector 341 of thefirst set of detectors remains uncovered (i.e. directly exposed). In thepresent example, the four elements or detectors (pixels) 351, 352, 353,354 of the second set of detectors surround the element or detector(pixel) 341 of the first set of detectors. With the filter,electromagnetic radiation outside the second wavelength band isprevented from reaching the detector elements 351-354.

It will be appreciated that the filter may be a single filter layerwhich has been pixelated such that it only covers the detectors of thesecond set. The imaging device may therefore be obtained by covering apixelated solid state sensor with a filter layer which is thensubsequently processed such that only some of the pixels of the solidstate sensors are covered by the filter, which thereby only receiveradiation in another wavelength band than the uncovered pixels. Thisresults in two different types of pixels which are sensitive to twodifferent wavelength bands (namely the first wavelength band and thesecond wavelength band). Although in the present specification examplesare provided for two different types of pixel, an imaging deviceincluding pixels of more than two types, i.e. pixels which are sensitivein several different (more than two) bands may be envisaged.

The manufacturing process for obtaining a pixelated filter may beperformed in accordance with for instance two alternatives as describedin the following.

According to a first alternative, a filter layer is first deposited onthe surface of a solid state imaging sensor. Then, a masking layer maybe applied on the deposited filter layer via photolithography such thatthe masking layer is patterned in accordance with the desired pattern ofthe filter. The filter layer may then be etched such that it is onlyremoved from some pixels of the solid state imaging sensor because ofthe masking layer.

According to another alternative, a lift-off process may be used whereinthe masking layer is first deposited (or applied) on the surface of thesolid state imaging sensor (via photolithography) an then the filterlayer is deposited on top of the masking layer. While removing themasking layer via e.g. etching, the filter layer will remain on thepixels of the solid state imaging sensor not protected by the maskinglayer. A pixelated filter layer is then obtained on top of the solidstate imaging sensor.

While capturing an image, each one of the detectors 341 and 351-354generates a signal. In the present illustration, the signals denoted361, 371, 372, 373, and 734 originate from the detectors 341, 351, 352,535, and 354, respectively. The signals 361, 371, 372, 373, 734 areinput to a processing unit or readout circuit 380.

As mentioned above, the detectors 341 and 351-354 may be part of atwo-dimensional array of elements including all the detectors of thefirst set and the detectors of the second set. The detectors (or pixels)may be arranged in a checker board pattern. In a similar way asdescribed above, all pixel elements in the two-dimensional array canhave a similar signal generation and readout.

The detectors 351-354 of the second set may each provide a referencesignal corresponding to a background level of electromagnetic radiationwithin the second wavelength band. The expected value of the level ofelectromagnetic radiation in the third wavelength band may then bederived from one or more of such reference signals. For example, theexpected value may be derived from a mean value of the four referencesignals obtained from the detectors 351-354 of the second set. Inparticular, the expected value may correspond to electromagneticradiation of a known spectral distribution in the third wavelength band,such as illustrated in for instance FIG. 2 with the expected behavior ofthe background environment.

The detector 341 may then generate a measurement signal from which adeviation of the level of electromagnetic radiation in the thirdwavelength band from the expected value, as determined above via thesignals from the detectors 351-354 of the second set, may be detected.In particular, the deviation may be obtained by subtracting themeasurement signal (or a corrected value of the measurement signal)generated by the detector 341 from the expected value, which may be amean value (or a corrected mean value) of reference signals generated byat least some of, such as e.g. detectors 351-354, of the second set ofdetectors. If there is a deviation (i.e. if the result of thecalculation is not zero or close to zero) then this means that there isa gas at the location corresponding to the pixel or detector 341.

In some embodiments, the imaging device may include an optical system(such as e.g. a lens, not shown) for altering optical focus in the imagecaptured by the imaging device, i.e. to blur the captured image. Thepurpose of the optical system is to compensate for the spatialdisplacement between the detector 341 of the first set of detectors,from which a measurement signal is obtained, and the detectors 351-354of the second set of detectors which provide the reference signals fromwhich the expected value to be used for the detector 341 of the firstset is derived. The captured image would become a bit unfocussed but thesurrounding pixels providing the reference signals would receiveelectromagnetic radiation from substantially the same location in theobserved environment as the pixel providing the measurement signal.

In some embodiments, an infrared imaging device such as described withreference to FIG. 3 may be part of an infrared camera.

In some embodiments, the imaging camera may also include an additionalimaging sensor (not shown) sensitive to visible light. The combinationof the two sensors is advantageous in that an image using visible lightmay be obtained onto which the “gas channel”, as obtained by forinstance the detector 341 of the imaging device 300 shown in FIG. 3, isadded in the form of a pointer (red mark). The pointer would thenindicate the presence and the position of the detected substance (e.g. agas). The images captured by the two sensors may be synchronized so thattheir respective fields of view correspond to each other or at leastoverlap. The sensors may also be synchronized in time.

As the first wavelength band includes the absorption peak (ortransmission or reflectance peak) of the gas (or the gases, in casethere are several gases having similar absorption characteristics) to bedetected and the second wavelength band is outside the absorption rangeof the gas to be detected, the signal from the detector or pixel 341 ofthe imaging device can use the surrounding pixels of the second set ofdetectors as a background reference such that presence of the gas can bedetected. It may also be possible from the amplitude of the deviation toquantify, at least in a relative manner, the amount of gas detected inthe pixel corresponding to detector 341. The amount of gas may be afunction of the difference in amplitude between the signal obtained atthe pixel of the first wavelength band and for instance a mean value ofthe closest (or surrounding) pixels of the second wavelength band. Assuch, each pixel of the first set of detectors corresponds to a gaschannel indicating directly presence or not of a gas (or othersubstance) to be detected by the imaging device without requiring theneed to identify the source of infrared radiation by furtherpost-processing of the captured image. It will be appreciated that insome embodiments, a detector of the second set may participate inseveral calculations.

FIGS. 4 and 5 show further graphs illustrating the operation principleof imaging devices in accordance with other embodiments.

The graph 400 shown in FIG. 4 is equivalent to the graph 200 shown inFIG. 2 except that it illustrates a deviation 460 from the expectedbehaviour 450 of the electromagnetic radiation in the third wavelengthband providing an increase in amplitude instead of a decrease inamplitude. This may be the case if the substance or object to be imaged(or detected) emits, transmits or reflects infrared radiation within thethird wavelength band at a higher level than what would have beenobtained by the background without presence of the substance or object.In FIG. 4, the curve denoted 440 represents the behaviour in case ofpresence of a substance. Further, the first wavelength band is denoted410 while the second wavelength band is denoted 420 and the thirdwavelength band is denoted 430. The second wavelength band represents awindow corresponding to longer wavelengths of the first wavelength band.

The graph 500 shown in FIG. 5 is equivalent to the graph 400 shown inFIG. 4 except that it illustrates that the second wavelength band fromwhich a reference signal may be obtained is positioned at lowerwavelengths of the first wavelength band. In FIG. 5, the firstwavelength band is denoted 510 while the second wavelength band isdenoted 520 and the third wavelength band is denoted 530. The secondwavelength band represents a window corresponding to lower wavelengthsof the first wavelength band. It will be appreciated that thispositioning of the second wavelength band relative to the first and thethird wavelength band is beneficial if the Planck curve for thebackground electromagnetic radiation decreases as a function of higherwavelengths which may be the case for longer wavelengths or at highertemperatures.

FIG. 6 schematically illustrates the positioning of the variouswavelength bands that may be involved in an imaging device such as inthe imaging devices 100 and 300 described with reference to FIGS. 1 and3, respectively. In this schematic illustration, it is assumed that theimaging device also includes a global filter for determining the widthof the first wavelength band. Such a global filter will be illustratedin FIG. 7.

In the illustration 600, the imaging device is shown to include adetector wavelength band 640 as determined by the sensitivity of thesolid state detectors (such as for instance the detectors 341 and351-354 shown in FIG. 3) forming the basic structure of the imagingdevice. As such, these detectors (both of the first set and the secondset) may be sensitive to electromagnetic radiation within the detectorwavelength band 640.

Via the global filter, however, only electromagnetic radiation withinthe first wavelength band 610 is allowed to reach the detectors (such asfor instance the detectors 341 and 351-354 shown in FIG. 3) of theimaging device. In the present example, the detector wavelength band 640is illustrated to extend outside the first wavelength band 610.

Further, the detectors of the second set (such as for instance thedetectors 351-354 shown in FIG. 3) are covered by a filter which onlyallows electromagnetic radiation within the second wavelength band 620to reach these detectors. The first set of detectors (such as detector341 shown in FIG. 3) will thereby be responsive to electromagneticradiation within the first wavelength band 610 and the second set ofdetectors (such as for instance the detectors 351-354 shown in FIG. 3)will be responsive to electromagnetic radiation within the secondwavelength band 620.

The difference between the first wavelength band 610 and the secondwavelength band 620 corresponds to the third wavelength band 630 withinwhich the imaging device is configured to detect a deviation from anexpected value. The second wavelength band 620 and the third wavelengthband 630 are subsets of the first wavelength band 610. Although notnecessary, in the present example, the second wavelength band 620 andthe third wavelength band 630 have approximately the same wavelengthwidth. Further, in the present example, the third wavelength band 630 ispositioned at lower wavelengths of the first wavelength band 610 thanthe second wavelength band 620.

FIG. 7 shows a cross-sectional view of an imaging device according to anembodiment.

The imaging device 700 shown in FIG. 7 may be equivalent to any one ofthe imaging detectors 100 and 300 described with reference to FIGS. 1and 3, respectively, except that it also comprises a global filter andan anti-reflecting coating which may be used to further adjust thewavelength bands and the sensitivity of the imaging device.

FIG. 7 may for instance represent a cross-sectional view along a row ofthe imaging device 300 shown in FIG. 3, such as for instance along therow including the detectors 351, 341, and 352. The imaging device 700includes a first set of detectors 740 and a second set of detectors 750.An optional anti-reflecting coating 730 may be deposited on top of thefirst set 740 and the second set 750 of detectors. A pixelated filter720, which may be manufactured such as described above with reference toFIG. 3, may be deposited on top of the optional anti-reflecting coatingsuch that the detectors of the second set are covered the filter 720. Inthe present example, the filter 720 may be directly applied on thesurface such that it is in direct contact with the detectors or with theoptional anti-reflecting coating if there is any. The width of the firstwavelength band may be determined by a global filter, which is apass-band filter. The global filter 725 may be mounted separate from thefirst set and the second set of detectors (i.e. with a certain gap fromthe filter 720) in e.g. a detector module.

The first set of detectors and the second set of detectors (i.e. thepixelated solid state sensor) may be bounded on top a readout chip 760.

While specific embodiments have been described, the skilled person willunderstand that various modifications and alterations are conceivablewithin the scope as defined in the appended claims.

The invention claimed is:
 1. An imaging device comprising: a first setof detectors responsive to infrared electromagnetic radiation in a firstwavelength band; a second set of detectors; and a filter disposed abovesaid second set of detectors to prevent registration of electromagneticradiation outside a second wavelength band at said second set ofdetectors, wherein said second wavelength band is a subset of said firstwavelength band; and wherein said imaging device is configured to detecta deviation from an expected value of a level of electromagneticradiation in a third wavelength band based on signals obtained from thefirst set of detectors and the second set of detectors, wherein saidthird wavelength band is within said first wavelength band and outsidesaid second wavelength band; and wherein at least one detector of thesecond set of detectors is configured to generate a reference signalcorresponding to a background level of electromagnetic radiation in saidsecond wavelength band, the expected value being derived from saidreference signal which is scaled in accordance with a known dependenceof the background level of infrared radiation in the second wavelengthband, the expected value corresponding to background electromagneticradiation in said third wavelength band.
 2. The imaging device accordingto claim 1, wherein said expected value corresponds to backgroundelectromagnetic radiation of a known spectral distribution in said thirdwavelength band.
 3. The imaging device according to claim 2, whereinsaid known spectral distribution corresponds to radiation from a blackbody radiator, a grey body radiator and/or a light source.
 4. Theimaging device according to claim 1, wherein at least one detector ofthe first set of detectors is configured to generate a measurementsignal, the imaging device being configured to determine said deviationbased on the expected value and the measurement signal.
 5. The imagingdevice according to claim 1, wherein a deviation from the expected valueindicates presence of a medium or substance within a field of view ofthe imaging device, said medium or substance having an absorption peak,a transmission peak and/or a reflectance peak within said thirdwavelength band.
 6. The imaging device according to claim 1, wherein theimaging device is configured to detect an amount of substance or mediumin that an amount of deviation from the expected value is indicative ofan amount of substance or medium having an absorption peak, atransmission peak and/or a reflectance peak in said third wavelengthband.
 7. The imaging device according to claim 5, wherein said medium orsubstance is a gas.
 8. The imaging device according to claim 1, whereinsaid second wavelength band represents a window corresponding to longerwavelengths of said first wavelength band.
 9. The imaging deviceaccording to claim 1, wherein said second wavelength band represents awindow corresponding to shorter wavelengths of said first wavelengthband.
 10. The imaging device according to claim 1, wherein the filter isconfigured to prevent electromagnetic radiation outside a secondwavelength band from reaching said second set of detectors.
 11. Theimaging device according to claim 10, wherein the filter comprises afirst filter layer determining an upper boundary of the secondwavelength band and a second filter layer determining a lower boundaryof the second wavelength band.
 12. The imaging device according to claim1, wherein the filter is configured to transmit electromagneticradiation above a threshold wavelength determining a lower boundary ofthe second wavelength band, the upper boundary being determined by theupper boundary of the first wavelength band, or wherein the filter isconfigured to attenuate electromagnetic radiation above a thresholdwavelength determining an upper boundary of the second wavelength band,the lower boundary being determined by the lower boundary of the firstwavelength band.
 13. The imaging device according to claim 1, wherein atleast one of the upper boundary and the lower boundary of the firstwavelength band is determined by the spectral sensitivity of thedetectors of the first set and the second set.
 14. The imaging deviceaccording to claim 1, further comprising a global filter disposed abovesaid first set of detectors and said second set of detectors.
 15. Theimaging device according to claim 14, wherein the global filter isconfigured to determine at least one boundary of said first wavelengthband.
 16. The imaging device according to claim 1, wherein said firstset of detectors and said second set of detectors are arranged in atwo-dimensional array.
 17. The imaging device according to claim 16,wherein said first set of detectors and said second set of detectors arearranged in a checker board pattern.
 18. The imaging device according toclaim 1, wherein said filter is an interference filter.
 19. The imagingdevice according to claim 1, wherein said filter is positioned incontact with said second set of detectors.
 20. The imaging deviceaccording to claim 1, further comprising an anti-reflecting coatingdisposed between said filter and said two-dimensional array.
 21. Theimaging device according to claim 1, wherein the device is configured toobtain said deviation by subtracting a measurement signal generated by adetector of the first set of detectors from a mean value of referencesignals generated by at least some detectors of the second set ofdetectors surrounding said detector of the first set or by subtracting ameasurement signal generated by a detector of the first set of detectorsfrom a mean value of reference signals generated by detectors of thesecond set detectors surrounding said detector of the first set.
 22. Theimaging device according to claim 1, wherein the detectors of the firstset of detectors and the second set of detectors are calibrated in orderto compensate for variation in gain and/or offset.
 23. The imagingdevice according to claim 1, wherein the second wavelength band coversapproximately half of the width of the first wavelength band.
 24. Theimaging device according to claim 1, wherein the first wavelength bandextends from approximately 3.2 micrometers to approximately 3.8micrometers while the second wavelength band extends from approximately3.5 micrometers to approximately 3.8 micrometers or wherein the firstwavelength band extends from approximately 10.3 micrometers toapproximately 10.7 micrometers while the second wavelength band extendsfrom approximately 10.3 micrometers to approximately 10.5 micrometers.25. The imaging device according to claim 1, wherein the secondwavelength band is positioned relative to the first wavelength band suchthat a contribution of a background level of electromagnetic radiationin a signal obtained for said second wavelength band is approximatelyequal to a signal level obtained for said third wavelength band.
 26. Theimaging device according to claim 1, further comprising an opticalsystem for altering optical focus in an image captured by the imagingdevice.
 27. An infrared camera comprising an imaging device as definedin claim
 1. 28. The infrared camera according to claim 27, furthercomprising an additional imaging sensor sensitive to visible light.